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selftests: firmware: Simplify test patterns
authorTakashi Iwai <tiwai@suse.de>
Thu, 21 Apr 2022 15:29:07 +0000 (17:29 +0200)
committerGreg Kroah-Hartman <gregkh@linuxfoundation.org>
Fri, 22 Apr 2022 06:51:17 +0000 (08:51 +0200)
commitf18b45ff9ac7ff05beeebd62d7c25d58f38b1410
treeff9d20fd0b12ee76a16fb99373cc8b893dee89e2tree | snapshot
parent04c826d0726720bc69617a291fad6e482ecf83d6commit | diff
selftests: firmware: Simplify test patterns

The test patterns are almost same in three sequential tests.
Make the unified helper function for improving the readability.

Link: https://lore.kernel.org/all/20210127154939.13288-1-tiwai@suse.de/
Signed-off-by: Takashi Iwai <tiwai@suse.de>
Link: https://lore.kernel.org/r/20220421152908.4718-5-tiwai@suse.de
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
tools/testing/selftests/firmware/fw_filesystem.sh diff | blob | history
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