From 2eb460ab9f4bc5b575f52568d17936da0af681d8 Mon Sep 17 00:00:00 2001 From: Shuicheng Lin Date: Tue, 15 Oct 2024 16:12:07 +0000 Subject: [PATCH] drm/xe: Enlarge the invalidation timeout from 150 to 500 There are error messages like below that are occurring during stress testing: "[ 31.004009] xe 0000:03:00.0: [drm] ERROR GT0: Global invalidation timeout". Previously it was hitting this 3 out of 1000 executions of warm reboot. After raising it to 500, 1000 warm reboot executions passed and it didn't fail. Due to the way xe_mmio_wait32() is implemented, the timeout is able to expire early when the register matches the expected value due to the wait increments starting small. So, the larger timeout value should have no effect during normal use cases. v2 (Jonathan): - rework the commit message v3 (Lucas): - add conclusive message for the fail rate and test case v4: - add suggested-by Suggested-by: Jia Yao Signed-off-by: Shuicheng Lin Cc: Lucas De Marchi Cc: Matthew Auld Cc: Nirmoy Das Reviewed-by: Jonathan Cavitt Tested-by: Zongyao Bai Reviewed-by: Nirmoy Das Signed-off-by: Matthew Auld Link: https://patchwork.freedesktop.org/patch/msgid/20241015161207.1373401-1-shuicheng.lin@intel.com --- drivers/gpu/drm/xe/xe_device.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/drivers/gpu/drm/xe/xe_device.c b/drivers/gpu/drm/xe/xe_device.c index 962751c966d1..22b572f0612c 100644 --- a/drivers/gpu/drm/xe/xe_device.c +++ b/drivers/gpu/drm/xe/xe_device.c @@ -925,7 +925,7 @@ void xe_device_l2_flush(struct xe_device *xe) spin_lock(>->global_invl_lock); xe_mmio_write32(>->mmio, XE2_GLOBAL_INVAL, 0x1); - if (xe_mmio_wait32(>->mmio, XE2_GLOBAL_INVAL, 0x1, 0x0, 150, NULL, true)) + if (xe_mmio_wait32(>->mmio, XE2_GLOBAL_INVAL, 0x1, 0x0, 500, NULL, true)) xe_gt_err_once(gt, "Global invalidation timeout\n"); spin_unlock(>->global_invl_lock); -- 2.20.1